Novel recursive inclusion-exclusion technology based on BAT and MPs for heterogeneous-arc binary-state network reliability problems
Wei‐Chang Yeh
Topics & Concepts
Benchmark (surveying)Reliability (semiconductor)Computer scienceBinary numberBinary treeState (computer science)Node (physics)Arc (geometry)Tree (set theory)Theoretical computer scienceMathematical optimizationAlgorithmMathematicsPower (physics)EngineeringCombinatoricsQuantum mechanicsGeographyGeometryStructural engineeringPhysicsGeodesyArithmeticReliability and Maintenance OptimizationAdvanced Battery Technologies ResearchSoftware Reliability and Analysis Research