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In situ X-ray imaging and numerical modeling of damage accumulation in C/SiC composites at temperatures up to 1200 °C

Weijian Qian, W Zhang, Shengchuan Wu, Yue Hu, Xiangyu Zhang, Qiaodan Hu, Shaoming Dong, Shan‐Tung Tu

2024Journal of Material Science and Technology97 citationsDOI

Topics & Concepts

Materials scienceComposite materialSilicon carbideUltimate tensile strengthDurabilityCeramic matrix compositeIn situThermalStructural materialCeramicPhysicsMeteorologyAdvanced ceramic materials synthesisAdvanced Surface Polishing TechniquesSilicon Carbide Semiconductor Technologies
In situ X-ray imaging and numerical modeling of damage accumulation in C/SiC composites at temperatures up to 1200 °C | Litcius