Square beams for optimal tiling in transmission electron microscopy
Eugene Chua, Lambertus Alink, Mykhailo Kopylov, Jake Johnston, Fabian Eisenstein, Alex de Marco
Abstract
Imaging large fields of view at a high magnification requires tiling. Transmission electron microscopes typically have round beam profiles; therefore, tiling across a large area is either imperfect or results in uneven exposures, a problem for dose-sensitive samples. Here, we introduce a square electron beam that can easily be retrofitted in existing microscopes, and demonstrate its application, showing that it can tile nearly perfectly and deliver cryo-electron microscopy imaging with a resolution comparable to conventional set-ups.
Topics & Concepts
MagnificationSquare (algebra)Electron microscopeTransmission electron microscopyOpticsResolution (logic)MicroscopeScanning transmission electron microscopyElectron tomographyMicroscopyTransmission (telecommunications)Cryo-electron microscopyConventional transmission electron microscopeMaterials scienceComputer sciencePhysicsMathematicsArtificial intelligenceGeometryNuclear magnetic resonanceTelecommunicationsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Fluorescence Microscopy Techniques