The new X-ray absorption fine-structure beamline with sub-second time resolution at the Taiwan Photon Source
Chih-Wen Pao, Jeng‐Lung Chen, Jyh‐Fu Lee, Meng‐Che Tsai, Chi-Yi Huang, C. C. Chiu, Chao-Yu Chang, Liang-Chih Chiang, Yu-Shan Huang
Abstract
The new TPS 44A beamline at the Taiwan Photon Source, located at the National Synchrotron Radiation Research Center, is presented. This beamline is equipped with a new quick-scanning monochromator (Q-Mono), which can provide both conventional step-by-step scans (s-scans) and on-the-fly scans (q-scans) for X-ray absorption fine-structure (XAFS) spectroscopy experiments, including X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine-structure (EXAFS) spectral measurements. Ti and Te K -edge XAFS spectra were used to demonstrate the capability of collecting spectra at the limits of the working energy range. The Ni and Cu K -edge XAFS spectra for a Cu-doped Pt/Ni nanocomposite were acquired to test the performance of the newly commissioned beamline. Pt L 3 - and Ru K -edge quick-scanning XAFS (QXAFS) spectra for standard Pt and Ru foils, respectively, revealed the stability of the q-scan technique. The results also demonstrated the beamline's ability to collect XAFS spectra on a sub-second timescale. Furthermore, a Zn (s) |Zn 2+ (aq) |Cu (s) system was tested to indicate that the states of the Zn electrode could be observed in real time for charging and discharging conditions using an in situ / operando setup combined with QXAFS measurements.