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Observation of nanoscale opto-mechanical molecular damping as the origin of spectroscopic contrast in photo induced force microscopy

Mohammad A. Almajhadi, Syed Mohammad Ashab Uddin, H. Kumar Wickramasinghe

2020Nature Communications43 citationsDOIOpen Access PDF

Abstract

Infrared photoinduced force microscopy (IR-PiFM) is a scanning probe spectroscopic technique that maps sample morphology and chemical properties on the nanometer (nm)-scale. Fabricated samples with nm periodicity such as self-assembly of block copolymer films can be chemically characterized by IR-PiFM with relative ease. Despite the success of IR-PiFM, the origin of spectroscopic contrast remains unclear, preventing the scientific community from conducting quantitative measurements. Here we experimentally investigate the contrast mechanism of IR-PiFM for recording vibrational resonances. We show that the measured spectroscopic information of a sample is directly related to the energy lost in the oscillating cantilever, which is a direct consequence of a molecule excited at its vibrational optical resonance-coined as opto-mechanical damping. The quality factor of the cantilever and the local sample polarizability can be mathematically correlated, enabling quantitative analysis. The basic theory for dissipative tip-sample interactions is introduced to model the observed opto-mechanical damping.

Topics & Concepts

PolarizabilityNanoscopic scaleMaterials scienceMolecular physicsMicroscopyChemical physicsMoleculeInfraredExcited stateOptoelectronicsNanometreInfrared spectroscopyOpticsCantileverContrast (vision)Dissipative systemAnalytical Chemistry (journal)Conductive atomic force microscopyNanotechnologyElectrostatic force microscopeMolecular vibrationAtomic force microscopySample (material)SpectroscopyNanostructureInfrared microscopyTransmission electron microscopyPolarization (electrochemistry)Force Microscopy Techniques and ApplicationsMechanical and Optical ResonatorsMaterial Dynamics and Properties