High-throughput characterization is key to report reliable organic thin-film transistor performance
Joseph G. Manion, Benoît H. Lessard
Topics & Concepts
ThroughputCharacterization (materials science)Thin-film transistorKey (lock)Materials scienceTransistorOptoelectronicsNanotechnologyComputer scienceElectrical engineeringEngineeringTelecommunicationsWirelessComputer securityVoltageLayer (electronics)Organic Electronics and PhotovoltaicsThin-Film Transistor TechnologiesSemiconductor materials and devices