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Constructing a correlation between ferroelectricity and grain sizes in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> ferroelectric thin films

Haiyan Chen, Hang Luo, Xi Yuan, Dou Zhang

2022CrystEngComm34 citationsDOI

Abstract

A correlation between ferroelectricity and grain sizes was constructed through controlling process conditions including annealing conditions and film thickness.

Topics & Concepts

FerroelectricityAnnealing (glass)Materials scienceGrain sizeThin filmCrystallographyCondensed matter physicsMineralogyOptoelectronicsComposite materialNanotechnologyChemistryPhysicsDielectricFerroelectric and Negative Capacitance DevicesMXene and MAX Phase MaterialsFerroelectric and Piezoelectric Materials
Constructing a correlation between ferroelectricity and grain sizes in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> ferroelectric thin films | Litcius