Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
Eleonora Vacca, Sarah Azimi, Luca Sterpone
Topics & Concepts
Redundancy (engineering)Field-programmable gate arrayStatic random-access memoryFault toleranceComputer scienceFailure rateRadiationReliability engineeringSoft errorEmbedded systemEngineeringElectronic engineeringComputer hardwarePhysicsQuantum mechanicsRadiation Effects in ElectronicsAdvanced Battery Technologies ResearchLow-power high-performance VLSI design