A stacking ensemble classifier with handcrafted and convolutional features for wafer map pattern classification
Hyungu Kang, Seokho Kang
Topics & Concepts
StackingClassifier (UML)Artificial intelligenceComputer scienceConvolutional neural networkWaferPattern recognition (psychology)AutomationSemiconductor device fabricationEnsemble learningMachine learningData miningEngineeringNuclear magnetic resonanceElectrical engineeringPhysicsMechanical engineeringIndustrial Vision Systems and Defect DetectionAdvancements in Photolithography TechniquesImage and Object Detection Techniques