Knowledge-based data augmentation of small samples for oil condition prediction
Yan Pan, Yunteng Jing, Tonghai Wu, Xiangxing Kong
Topics & Concepts
Reliability (semiconductor)Degradation (telecommunications)Data miningComputer scienceSample (material)Reliability engineeringStatisticsEngineeringMathematicsTelecommunicationsChromatographyChemistryQuantum mechanicsPhysicsPower (physics)Fault Detection and Control SystemsSpectroscopy and Chemometric AnalysesWater Systems and Optimization