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Compact Modeling of Static and Transient Effects of Buffer Traps in GaN HEMTs

Ajay Shanbhag, M. P. Sruthi, Anjan Chakravorty, Nandita DasGupta, Amitava DasGupta

2022IEEE Transactions on Electron Devices17 citationsDOI

Abstract

We propose a physics-based analytical model that accurately captures the effects of buffer traps on dc characteristics of gallium nitride (GaN)-based high-electron-mobility transistors (HEMTs). The model is then semi-analytically extended to additionally include the transient behavior. Analytical formulations for the shift in the threshold voltage <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${(}{V}_{\text {OFF}}{)}$ </tex-math></inline-formula> and two-dimensional electron gas (2-DEG) density due to the presence of buffer traps in the steady state are presented. In pulsed operation, technology computer-aided design (TCAD) simulations indicate that a time-dependent negative potential (NP) is developed under the gate, resulting in a modified <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {OFF}}$ </tex-math></inline-formula> and current collapse (CC). An expression for the modified <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {off}}$ </tex-math></inline-formula> helps capture the pulsed current–voltage characteristics. The model captures the dependence of bias, time, temperature, trap concentration, capture cross section area, and activation energy of traps on the steady-state and transient characteristics. The model is implemented in Verilog-A in an existing compact model framework using a diode and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">RC</i> sub-circuit and validated using measured data and TCAD simulations. The modeling results are in excellent agreement with the experimental data and TCAD simulations. Since the model is physics-based, it requires fewer number of parameters compared to that in the existing models.

Topics & Concepts

Transient (computer programming)Gallium nitrideTopology (electrical circuits)PhysicsOptoelectronicsAlgorithmElectrical engineeringMaterials scienceComputer scienceEngineeringNanotechnologyProgramming languageLayer (electronics)GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices