Dependence of RF/Analog and Linearity Figure of Merits on Temperature in Ferroelectric FinFET: A Simulation Study

Abstract

This article presents a simulation study of the impact of variation in temperature on the transfer characteristics and the RF/analog performance like transconductance (g <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">m</sub> ), gate capacitance (C <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gg</sub> ), cutoff frequency (f <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">t</sub> ), and transconductance frequency product (TFP) of the ferroelectric FinFET (Fe-FinFET). In addition, the impact of temperature on the linearity parameters such as higher order harmonics (g <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">m2</sub> and g <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">m3</sub> ), second- and third-order voltage intercept points (VIP <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> and VIP <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ), third-order power-intercept point (IIP <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ), third-order intermodulation distortion (IMD <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> ), and 1-dB compression point is estimated for wide variation of temperature in the Fe-FinFET. It is seen that temperature has a significant impact on the RF/analog and linearity parameters, and these figure of merits (FoMs) are the functions of temperature. Analysis reports that RF/analog parameters are suppressed, whereas the linearity FoMs are improved as temperature changed from 250 to 350 K.

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