Integrated Stateflow-based simulation modelling and testability evaluation for electronic built-in-test (BIT) systems
Junyou Shi, Qingjie He, Zili Wang
Topics & Concepts
TestabilityStateflowReliability engineeringComputer scienceFault coverageFault injectionFault (geology)False alarmEmbedded systemComputer engineeringElectronic engineeringEngineeringSoftwareArtificial intelligenceProgramming languageGeologySeismologyMATLABElectronic circuitElectrical engineeringVLSI and Analog Circuit TestingEngineering and Test SystemsRadiation Effects in Electronics