Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System
Olivier D. Bernal, Usman Zabit, Francis Jayat, Thierry Bosch
Abstract
In this paper, a method based on the inherent event-based sampling capability of the laser optical feedback interferometry (OFI) is proposed to recover sub-λ/2 displacement with a nanometric precision. The proposed method operates in open-loop configuration and relies on OFI's fringe detection, thereby improving its robustness and ease of use. The measured white noise power spectral density is less than 100 pm/ √Hz with a corner noise frequency of approximately 80Hz for a laser diode emitting wavelength λ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> of 785 nm placed at 30cm of the target.
Topics & Concepts
InterferometryLaser diodeOpticsRobustness (evolution)LaserSampling (signal processing)WavelengthPhysicsRangingDisplacement (psychology)Noise (video)DiodeComputer scienceDetectorOptoelectronicsTelecommunicationsArtificial intelligenceBiochemistryChemistryImage (mathematics)PsychotherapistGenePsychologySemiconductor Lasers and Optical DevicesPhotonic and Optical DevicesAnalytical Chemistry and Sensors