Measuring residual stress in Ti-6Al-4V with HR-EBSD, using reference patterns from annealed material
Andrew Deal, Ian Spinelli, Andrew Chihpin Chuang, Yan Gao, Thomas F. Broderick
Topics & Concepts
Electron backscatter diffractionMaterials scienceResidual stressRepeatabilityDiffractionComposite materialMicrostructureOpticsChromatographyPhysicsChemistryTitanium Alloys Microstructure and PropertiesMetal and Thin Film MechanicsWelding Techniques and Residual Stresses