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Extraction of thickness, linear and nonlinear optical parameters of Ge20+Se80- thin films at normal and slightly inclined light for optoelectronic devices

Meshal Alzaid, Ammar Qasem, E.R. Shaaban, N. M. A. Hadia

2020Optical Materials76 citationsDOI

Topics & Concepts

Refractive indexThin filmMaterials scienceOpticsTransmittanceAttenuation coefficientAmorphous solidDispersion (optics)Molar absorptivityChalcogenideWavelengthAnalytical Chemistry (journal)OptoelectronicsChemistryPhysicsCrystallographyNanotechnologyChromatographyPhase-change materials and chalcogenidesNonlinear Optical Materials StudiesChalcogenide Semiconductor Thin Films
Extraction of thickness, linear and nonlinear optical parameters of Ge20+Se80- thin films at normal and slightly inclined light for optoelectronic devices | Litcius