Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels
Da-wei Gao, Yongsheng Zhu, Yan Ke, Hong Fu, Zhijun Ren, Wei Kang, C. Guedes Soares
Topics & Concepts
Computer scienceFeature extractionPattern recognition (psychology)Artificial intelligenceRegularization (linguistics)Entropy (arrow of time)Artificial neural networkMachine learningFeature vectorFault (geology)Data miningQuantum mechanicsPhysicsGeologySeismologyMachine Fault Diagnosis TechniquesNon-Destructive Testing TechniquesFatigue and fracture mechanics