Quadri-wave lateral shearing interferometry: a versatile tool for quantitative phase imaging
Jun Xie, Huimin Xie, Cheng Zhen Kong, Tong Ling
Abstract
microstructure characterization for advanced manufacturing, and high-speed imaging of material property changes. Among various QPI methods, quadri-wave lateral shearing interferometry (QWLSI) stands out for its unique advantages in compactness, robustness, and high temporal resolution, making it an ideal choice for a wide range of applications. The compact design of QWLSI allows for easy integration with existing microscopy systems, while its robustness is manifested in the ability to maintain precise interferometric sensitivity even in high-vibration environments. Moreover, QWLSI also enables single-shot measurements that facilitate the capture of fast dynamic processes. This paper provides an in-depth exploration of the technical aspects of QWLSI, focusing on the evolution of its optical system and the primary algorithms used in wavefront reconstruction. The review also showcases significant applications of QWLSI, with a particular emphasis on its contributions to biomedical imaging. By discussing the advantages, limitations, and potential future developments of QWLSI, this paper aims to provide a comprehensive overview of this powerful QPI technique and its impact on various research fields.