Single Event Upset Characterization of the Intel Movidius Myriad X VPU and Google Edge TPU Accelerators Using Proton Irradiation
Devin P. Ramaswami, David M. Hiemstra, Zhi Wu Yang, Shuting Shi, Li Chen
Abstract
Proton induced SEU cross-sections of the Movidius Myriad X VPU and Google Edge TPU are presented. Upset rates in the space radiation environment are estimated and found to be acceptable for low orbit missions.
Topics & Concepts
UpsetSingle event upsetProtonIrradiationEnhanced Data Rates for GSM EvolutionCharacterization (materials science)Computer scienceEvent (particle physics)PhysicsNuclear physicsEngineeringOpticsComputer hardwareAstrophysicsTelecommunicationsMechanical engineeringStatic random-access memoryRadiation Effects in ElectronicsParticle Detector Development and PerformanceRadiation Therapy and Dosimetry