Revisiting the application of twin connected parallel networks and regression loss functions in industrial defect detection
Zhanzhi Su, Mingle Zhou, Min Li, Zekai Zhang, Delong Han, Gang Li, Gang Li
Topics & Concepts
RegressionComputer scienceParallel computingMathematicsStatisticsIndustrial Vision Systems and Defect DetectionAdvanced Measurement and Detection MethodsImage and Object Detection Techniques