MD-YOLO: Surface Defect Detector for Industrial Complex Environments
Hongxin Zheng, Xiaoxin Chen, Hao Cheng, Yixian Du, Zhansi Jiang
Topics & Concepts
Computer scienceRobustness (evolution)Artificial intelligenceBlock (permutation group theory)DetectorComputer visionProcess (computing)Block sizeChannel (broadcasting)Pattern recognition (psychology)TelecommunicationsOperating systemGeometryChemistryComputer securityGeneMathematicsBiochemistryKey (lock)Industrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsImage and Object Detection Techniques