Litcius/Paper detail

Extended-Sampling-Bayesian Method for Limited Aperture Inverse Scattering Problems

Zhaoxing Li, Zhiliang Deng, Jiguang Sun

2020SIAM Journal on Imaging Sciences35 citationsDOI

Abstract

Limited aperture inverse scattering problems arise in many important applications. In this paper, we propose a new method combining the extended sampling method (ESM) and the Bayesian approach for the inverse acoustic scattering problem to reconstruct the shape of a sound-soft obstacle using the limited aperture data. The problem is formulated as a statistical model using the Bayes formula. The well-posedness is proved in the sense of the Hellinger metric. A modified ESM is proposed to obtain the obstacle location, which is critical to the convergence of the MCMC algorithm. An extensive numerical study is presented to illustrate the performance of the method.

Topics & Concepts

Inverse problemInverse scattering problemObstacleAperture (computer memory)AlgorithmHellinger distanceSampling (signal processing)Convergence (economics)Bayesian probabilityMathematical optimizationComputer scienceMetric (unit)MathematicsApplied mathematicsArtificial intelligenceMathematical analysisComputer visionPhysicsAcousticsFilter (signal processing)Economic growthEconomicsOperations managementPolitical scienceLawNumerical methods in inverse problemsMicrowave Imaging and Scattering AnalysisSparse and Compressive Sensing Techniques