Comprehensive study of gate induced drain leakage in nanowire and nanotube junctionless FETs using Si1-xGex source/drain
Anchal Thakur, Rohit Dhiman
Topics & Concepts
Materials scienceNanowireQuantum tunnellingDrain-induced barrier loweringLeakage (economics)OptoelectronicsField-effect transistorTransistorNanotechnologyIonNanotubeBand gapElectrical engineeringVoltageCarbon nanotubeChemistryEngineeringOrganic chemistryMacroeconomicsEconomicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis