Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
Saulo G. Alberton, Vitor A. P. Aguiar, N. H. Medina, N. Added, Eduardo Luiz Augusto Macchione, R. Menegasso, Greiciane J. Cesário, Hellen Cristine Santos, V. Scarduelli, J.A. Alcántara-Núñez, M. Guazzelli, R.B.B. Santos, D. Flechas
Topics & Concepts
VoltageMaterials sciencePower MOSFETIonDeposition (geology)Power (physics)Heavy ionTransistorMOSFETEvent (particle physics)Charge (physics)OptoelectronicsElectrical engineeringChemistryPhysicsEngineeringBiologyOrganic chemistryPaleontologyQuantum mechanicsSedimentRadiation Effects in ElectronicsAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devices