An optimized TEM specimen preparation method of quantum nanostructures
Hongguang Wang, Vesna Šrot, Bernhard Fenk, Gennadii Laskin, J. Mannhart, Peter A. van Aken
Topics & Concepts
Materials scienceFocused ion beamLamella (surface anatomy)Ion milling machineNanostructureQuantum dotMicrostructureTransmission electron microscopyPolishingNanotechnologyAmorphous solidSample preparationIon beamOptoelectronicsLayer (electronics)Composite materialIonBeam (structure)OpticsCrystallographyChemistryPhysicsChromatographyOrganic chemistryElectronic and Structural Properties of OxidesQuantum Dots Synthesis And PropertiesGa2O3 and related materials