High-endurance micro-engineered LaB6 nanowire electron source for high-resolution electron microscopy
Han Zhang, Yu Jimbo, Akira Niwata, Akihiro Ikeda, Akira Yasuhara, Ovidiu Cretu, Koji Kimoto, Takeshi Kasaya, Hideki T. Miyazaki, Naohito Tsujii, Hongxin Wang, Yasushi Yamauchi, Daisuke Fujita, Shinichi Kitamura, Hironobu Manabe
Topics & Concepts
Field electron emissionMaterials scienceNanowireCommon emitterOptoelectronicsCollimatorOpticsCathode rayCollimated lightElectronElectron gunElectron beam-induced depositionScanning transmission electron microscopyNanotechnologyTransmission electron microscopyLaserPhysicsQuantum mechanicsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques