Ultrafast nanoimaging of the order parameter in a structural phase transition
Thomas Danz, Till Domröse, Claus Ropers
Abstract
-polytype of tantalum disulfide) thin film and image the transient state of the specimen by ultrashort electron pulses. A tailored dark-field aperture array allows us to track the evolution of charge-density wave domains in the material with simultaneous femtosecond temporal and 5-nanometer spatial resolution, elucidating relaxation pathways and domain wall dynamics. The distinctive benefits of selective contrast enhancement will inspire future beam-shaping technology in ultrafast transmission electron microscopy.
Topics & Concepts
Ultrashort pulseFemtosecondOpticsMaterials scienceLaserPhase (matter)OptoelectronicsRelaxation (psychology)Transmission electron microscopyFemtosecond pulse shapingMicroscopyUltrafast laser spectroscopyElectronPhysicsMicroscopeMultiphoton intrapulse interference phase scanTransient (computer programming)Numerical apertureElectron microscopePulse shapingTemporal resolutionInterferometryPhase transitionNanotechnologyThin filmAdvanced Electron Microscopy Techniques and ApplicationsElectronic and Structural Properties of Oxides2D Materials and Applications