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DC and RF/analog performances of split source horizontal pocket and hetero stack TFETs considering interface trap charges: A simulation study

Shreyas Tiwari, Rajesh Saha

2022Microelectronics Reliability35 citationsDOI

Topics & Concepts

Stack (abstract data type)Trap (plumbing)Interface (matter)Electrical engineeringOptoelectronicsMaterials scienceElectronic engineeringComputer scienceEngineeringPhysicsQuantum mechanicsMoleculeOperating systemEnvironmental engineeringGibbs isothermAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices
DC and RF/analog performances of split source horizontal pocket and hetero stack TFETs considering interface trap charges: A simulation study | Litcius