Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides
J. Koaib, N. Bouguila, H. Abassi, N. Moutia, M. Kraini, A. Timoumi, C. Vázquez‐Vázquez, K. Khirouni, S. Alaya
Abstract
The annealing temperature (<italic>T</italic><sub>a</sub>) dependence of the structural, morphological, electrical and dielectric properties of ZnS thin films was investigated.
Topics & Concepts
DielectricMaterials scienceThermal conductionElectrical conductionMechanism (biology)Composite materialAnnealing (glass)Condensed matter physicsOptoelectronicsPhysicsQuantum mechanicsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesPhase-change materials and chalcogenides