Deep learning-based discriminative refocusing of scanning electron microscopy images for materials science
Juwon Na, Gyuwon Kim, Seong-Hoon Kang, Se‐Jong Kim, Seung‐Chul Lee
Topics & Concepts
Convolutional neural networkScanning electron microscopeArtificial intelligenceDeep learningFocus (optics)Computer scienceMaterials scienceScale (ratio)Artificial neural networkPattern recognition (psychology)OpticsPhysicsComposite materialQuantum mechanicsAdvanced Electron Microscopy Techniques and ApplicationsImage Processing Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure Analysis