YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards

Gao Yun-peng, Zhang Rui, Yang Mingxu, Fahad Sabah

2024Journal of Electronic Testing11 citationsDOI

Topics & Concepts

Printed circuit boardAlgorithmComputer scienceOperating systemIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Neural Network Applications