Evaluation of properties of sputtered Ni/Cu films with different thicknesses of the Cu layer
Salih Çölmekçi, Ali Karpuz, Hakan Köçkar
Topics & Concepts
Materials scienceCoercivityLayer (electronics)CopperScanning electron microscopeAnalytical Chemistry (journal)Thin filmSputter depositionDiffractionSputteringCrystallizationComposite materialOpticsMetallurgyChemistryNanotechnologyCondensed matter physicsChromatographyPhysicsOrganic chemistryMagnetic properties of thin filmsMagnetic Properties and ApplicationsCopper Interconnects and Reliability