Bit Error Rate Analysis of Pre-formed ReRAM-based PUF
Saloni Jain, Taylor Wilson, Sareh Assiri, Bertrand Cambou
Topics & Concepts
Resistive random-access memoryPhysical unclonable functionComputer scienceKey generationCryptographyKey (lock)Bit error rateElectronic engineeringElectrical engineeringComputer networkAlgorithmComputer securityEngineeringVoltageChannel (broadcasting)Advanced Memory and Neural ComputingPhysical Unclonable Functions (PUFs) and Hardware SecurityNeuroscience and Neural Engineering