Single Event Hard Error due to Terrestrial Radiation
Jin‐Woo Han, M. Meyyappan, Jungsik Kim
Abstract
Terrestrial radiation is ubiquitous. Alpha particle radioactive contamination is often found in semiconductor packaging materials, and neutrons generated by cosmic rays constantly approach the ground. Historically, these radiations are regarded as a source of soft-error. We are in the era of aggressive device miniaturization, operation voltage scaling and increasing frequency. Herein, we present that the terrestrial radiation-induced single event can potentially result in hard-error. As a result, radiation hard-error hardening might be necessary in the near future even in consumer electronics.
Topics & Concepts
Soft errorCosmic rayRadiationSingle event upsetRadiation hardeningElectronicsEvent (particle physics)MiniaturizationComputer scienceNeutronEnvironmental scienceNuclear engineeringPhysicsElectrical engineeringElectronic engineeringOpticsNuclear physicsEngineeringComputer hardwareAstrophysicsStatic random-access memoryRadiation Effects in ElectronicsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis