Characterization of microscopic residual stresses: A review
Yang Hong, Chengxi Wang, Lianbo Wang, Shuohong She, Jilin Lei, Vincent Ji
Topics & Concepts
Residual stressCharacterization (materials science)Materials scienceNanoindentationResidualDigital image correlationStress (linguistics)Focused ion beamComposite materialComputer scienceNanotechnologyAlgorithmPhysicsPhilosophyLinguisticsQuantum mechanicsIonWelding Techniques and Residual StressesMetal and Thin Film MechanicsIntegrated Circuits and Semiconductor Failure Analysis