A data generation method with dual discriminators and regularization for surface defect detection under limited data
Bo-Heng Liu, Tianrui Zhang, Yu Yao, Ligang Miao
Topics & Concepts
OverfittingDiscriminatorComputer scienceRegularization (linguistics)Artificial intelligenceEarly stoppingData miningPattern recognition (psychology)Machine learningArtificial neural networkDetectorTelecommunicationsIndustrial Vision Systems and Defect DetectionWelding Techniques and Residual StressesIntegrated Circuits and Semiconductor Failure Analysis