Image reconstruction based on TV-L1 model for planar array capacitance defect detection
Yurong Sun, Ruicheng Zhang
Topics & Concepts
PlanarCapacitanceMaterials scienceOptoelectronicsElectronic engineeringComputer scienceOpticsEngineeringComputer graphics (images)PhysicsElectrodeQuantum mechanicsIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure Analysis