Revisiting metric learning for few-shot image classification
Xiaomeng Li, Lequan Yu, Chi‐Wing Fu, Meng Fang, Pheng‐Ann Heng
Topics & Concepts
Discriminative modelMetric (unit)Artificial intelligenceEmbeddingComputer scienceBenchmark (surveying)Pattern recognition (psychology)Feature (linguistics)Shot (pellet)Machine learningSimilarity (geometry)Class (philosophy)Feature learningRepresentation (politics)Deep learningImage (mathematics)EconomicsLawPolitical scienceGeodesyOrganic chemistryLinguisticsPoliticsOperations managementPhilosophyGeographyChemistryDomain Adaptation and Few-Shot LearningAdvanced Image and Video Retrieval TechniquesCOVID-19 diagnosis using AI