Luminescence Thermometry via Multiparameter Sensing in YV<sub>1–<i>x</i></sub>P<i><sub><i>x</i></sub></i>O<sub>4</sub>:Eu<sup>3+</sup>, Er<sup>3+</sup>
Yixuan Ma, Xiaopeng Zhou, Jiapeng Wu, Zhijie Dong, L. Cui, Yuhua Wang, Andries Meijerink
Abstract
High Resolution Image Download MS PowerPoint Slide Luminescence thermometry is a remote temperature sensing technique that utilizes temperature-dependent luminescence properties. Lanthanide-doped materials with two thermally coupled emitting levels displaying a variation in luminescence intensity ratio (LIR) with temperature have been successfully explored to design sensitive luminescent thermometers. However, the low absorption strength of lanthanide parity-forbidden 4f n → 4f n transitions reduces the brightness. Also, this Boltzmann-type thermometer is only sensitive within a limited temperature range. To address these issues, we report here YV 1– x P x O 4:Eu 3+, Er 3+ as a luminescent thermometer. This material utilizes the sensitized emission of Ln 3+ by strong and broad vanadate charge transfer absorption and has a wide and tunable optimum temperature range by controlling the thermal quenching of Eu 3+ emission through a variation of x . The new temperature probe offers a single material with multiple temperature-dependent luminescence properties, viz. the LIR of 2 H 11/2 / 4 S 3/2 emission of Er 3+, the LIR of the integrated Er 3+ and Eu 3+ emission intensities, and the Eu 3+ emission lifetime. Both micro- and nanocrystalline temperature probes are reported to achieve relative sensitivities ( S r ) from ∼0.5%/K to over 5%/K in a wide temperature range of 300–873 K. To demonstrate practical applicability, the luminescent thermometer was applied to in situ chip temperature detection revealing temperature accuracies better than 1 K.