Machine learning-based 3D scan coverage prediction for smart-control applications
Tingcheng Li, Arnaud Polette, Ruding Lou, Manon Jubert, Dominique Nozais, Jean-Philippe Pernot
Topics & Concepts
Computer scienceMachine learningControl (management)Artificial intelligenceIndustrial Vision Systems and Defect DetectionAdvanced Vision and ImagingOptical measurement and interference techniques