Silica: ubiquitous poison of metal oxide interfaces
Anna Staerz, Han Gil Seo, Thomas Defferriere, Harry L. Tuller
Abstract
In this review, we consider the detrimental effects of Si-contamination on electrochemical applications, broadly conceived, in which both ions and electrons play key roles in device operation and where exchange of oxygen between the gas and solid phase is likewise essential for operation.
Topics & Concepts
OxideElectrochemistryKey (lock)MetalInterface (matter)Materials sciencePhase (matter)NanotechnologyGas phaseComputer scienceElectrodeChemistryComputer securityMetallurgyComposite materialCapillary numberCapillary actionPhysical chemistryOrganic chemistryGas Sensing Nanomaterials and SensorsElectronic and Structural Properties of OxidesSemiconductor materials and devices