Fabrication of a graphene layer probe to measure force interactions in layered heterojunctions
Jianfeng Li, Jianfeng Li, Jinjin Li, Jinjin Li, Liang Jiang, Jianbin Luo
Abstract
). The variations of friction, adhesion, and van der Waals (vdW) interaction were consistent with the variations of the interlayer shear stress, the surface energy of the composed 2D layered materials, and the Hamaker constant of the heterojunctions, respectively. The good agreement between the measurements and theories confirms that this method is reliable for the fabrication of graphene or other 2D layered material probes and can be widely used for layered heterojunction measurements.
Topics & Concepts
HeterojunctionGrapheneMaterials sciencevan der Waals forceNanotechnologyFabricationSemiconductorLayer (electronics)AdhesiveOptoelectronicsComposite materialMoleculeChemistryOrganic chemistryPathologyAlternative medicineMedicineForce Microscopy Techniques and ApplicationsGraphene research and applicationsDiamond and Carbon-based Materials Research