A Temperature-Dependent $dV_{CE}/dt$ and $dI_{C}/dt$ Model for Field-Stop IGBT at Turn-on Transient
Peng Xue, Pooya Davari
Abstract
In this article, a complete expression for <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dV_{CE}/dt$</tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dI_{C}/dt$</tex-math></inline-formula> at turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> transient of field-stop (FS) insulated gate bipolar transistor (IGBT) is proposed. With numerical simulation utilized, the critical stray elements and internal physics which have a significant impact on turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> behavior of FS IGBT are identified. Based on the improved understanding on the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> behavior, the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> transient is divided into two phases and the equivalent circuits of each phase are obtained. The analytical expressions of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dV_{CE}/dt$</tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dI_{C}/dt$</tex-math></inline-formula> during the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> transient are thereby derived based on the equivalent circuits. The temperature dependency on the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> characteristics of FS IGBT is identified by the experimental data. The temperature-dependent models of various device parameters are proposed to describe the temperature dependency. In the end, the double-pulse test is performed on a 650-V FS IGBT and a 1200-V FS IGBT. The good agreement between the test and analytically derived results validates that the proposed FS IGBT model can accurately predict the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dV_{CE}/dt$</tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$dI_{C}/dt$</tex-math></inline-formula> during the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> transient.