Uncertainty evaluation of an on-machine chromatic confocal measurement system
Long Ye, Jun Qian, Han Haitjema, Dominiek Reynaerts
Topics & Concepts
Flatness (cosmology)Measurement uncertaintySurface finishComputer scienceVibrationQuality assuranceMachine visionArtificial intelligenceEngineeringMechanical engineeringAcousticsMathematicsStatisticsOperations managementQuantum mechanicsExternal quality assessmentCosmologyPhysicsAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical MeasurementsOptical measurement and interference techniques