Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction
Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, Wenjun Liu, Kai Chen, Yubin Zhang
Abstract
A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.
Topics & Concepts
Materials scienceSynchrotronMonochromatic colorDislocationSynchrotron radiationX-rayCrystallographyX-ray crystallographyDiffractionCondensed matter physicsOpticsPhysicsComposite materialChemistryHigh Temperature Alloys and CreepMicrostructure and mechanical propertiesMicrostructure and Mechanical Properties of Steels