An overview of HR-EBSD techniques for mapping local stress and dislocations in crystalline materials at sub-micron resolution
Timothy Ruggles, William G. Gilliland, David T. Fullwood, Josh Kacher
Topics & Concepts
Electron backscatter diffractionMaterials scienceCharacterization (materials science)DislocationMicroelectronicsResolution (logic)Image resolutionDiffractionOrientation (vector space)Stress (linguistics)Backscatter (email)CrystallographyPlasticityOpticsScanning electron microscopeEngineering physicsHigh resolutionElectron diffractionComposite materialMicrostructure and mechanical propertiesNon-Destructive Testing TechniquesMetal and Thin Film Mechanics