Atomic-scale observations of electrical and mechanical manipulation of topological polar flux closure
Xiaomei Li, Congbing Tan, Chang Liu, Peng Gao, Yuanwei Sun, Pan Chen, Mingqiang Li, Lei Liao, Ruixue Zhu, Jinbin Wang, Yanchong Zhao, Lifen Wang, Zhi Xu, Kaihui Liu, Xiangli Zhong, Jie Wang, Xuedong Bai
Abstract
Significance Flux-closures, stable topological polar structures of nanometer size, are considered to be promising candidates as elements of future nanoelectronic and electromechanical devices. Understanding their phase transition pathways under external stimuli is therefore of vital importance for these potential applications. Here, using an atomically resolved in situ electron microscopy technique, we track the evolutions of the polarization of the flux-closure structure under both electric and stress fields with atomic resolution. We find that the flux-closure can be reversibly and controllably manipulated between the topological and ordinary ferroelectric states, enabling potential applications in electromechanical and nanoelectronic devices.