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Uncovering multiscale structure-property correlations via active learning in scanning tunneling microscopy

G. Narasimha, Dejia Kong, Paras Regmi, Rongying Jin, Zheng Gai, Rama K. Vasudevan, Maxim Ziatdinov

2025npj Computational Materials10 citationsDOIOpen Access PDF

Abstract

Abstract Atomic arrangements and local sub-structures fundamentally influence emergent material functionalities. These structures are conventionally probed using spatially resolved studies and the property correlations are deciphered by a researcher based on sequential explorations, thereby limiting the efficiency and scope. Here we demonstrate a multi-scale Bayesian deep-learning based framework that automatically correlates material structure with its electronic properties using scanning tunneling microscopy (STM) measurements in real-time. Its predictions are used to autonomously direct exploration toward regions of the sample that optimize a given material property. This method is deployed on a low-temperature ultra-high vacuum STM to understand the structure-property relationship in a europium-based semimetal, EuZn 2 As 2 , a promising candidate relevant to magnetism-driven topological phenomena. The framework employs a sparse-sampling approach to efficiently construct the scalar-property space using minimal measurements, about 1–10% of the data required in standard hyperspectral methods. Moreover, we formulate the problem hierarchically across length scales, implementing autonomous workflow to locate mesoscopic and atomic structures that correspond to a target material property. This framework offers the choice to design scalar-property from the spectroscopic data to steer sample exploration. Our findings reveal correlations of the electronic properties unique to surface terminations, local defect density, and point defects.

Topics & Concepts

Scanning tunneling microscopeProperty (philosophy)Computer scienceMaterials scienceNanotechnologyArtificial intelligencePhilosophyEpistemologyMachine Learning in Materials ScienceSurface and Thin Film PhenomenaElectronic and Structural Properties of Oxides