A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS
Sarah Azimi, Corrado De Sio, Andrea Portaluri, Daniele Rizzieri, Luca Sterpone
Topics & Concepts
CMOSReliability (semiconductor)Field-programmable gate arrayRadiation hardeningRadiationSensitivity (control systems)Electronic engineeringComputer scienceEngineeringOptoelectronicsPhysicsEmbedded systemOpticsPower (physics)Quantum mechanicsRadiation Effects in ElectronicsVLSI and Analog Circuit TestingLow-power high-performance VLSI design