Simple extension of the plane-wave final state in photoemission: Bringing understanding to the photon-energy dependence of two-dimensional materials
Christian S. Kern, Anja Haags, Larissa Egger, Xiaosheng Yang, Hans Kirschner, Susanne Wolff, Thomas Seyller, Alexander Gottwald, M. Richter, Umberto De Giovannini, Ángel Rubio, Michael G. Ramsey, François C. Bocquet, Serguei Soubatch, F. Stefan Tautz, Peter Puschnig, Simon Moser
Abstract
The photoemission cross section of graphene is measured for two light polarizations and a wide range of photon energies at a flux-calibrated synchrotron light source. Modeling scattering effects by a simplistic model and sophisticated time-dependent density-functional-theory calculations, the complex phase shifts in the photoemission final state are extracted from the experiment to obtain complete information about the photoemission process.
Topics & Concepts
Angle-resolved photoemission spectroscopyPhoton energyInverse photoemission spectroscopyPhotonScatteringPhysicsSynchrotron radiationExtension (predicate logic)Atomic physicsPhotoemission spectroscopySynchrotronRange (aeronautics)GrapheneComputational physicsCondensed matter physicsElectronic structureMaterials scienceOpticsSpectral lineQuantum mechanicsComputer scienceComposite materialProgramming languageElectron and X-Ray Spectroscopy TechniquesSurface and Thin Film PhenomenaElectronic and Structural Properties of Oxides